Showing results: 736 - 750 of 1046 items found.
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GL Communications Inc.
T3 E3 Analysis software compliments the hardware and supports simultaneously monitoring up to 12 x T3 E3 lines (2x Rack units) for all alarms, frame errors, signalling and data. If one adds the Channelized T1 Analyzer software to the system, then the T1s within the T3s can also be analysed in software, 12 x T3 E3 lines (=12*28 T1s) constituting 336 full duplex T1s, or 672 simplex T1s monitored simultaneously using a single Rack unit.
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SierraNet M328 -
Teledyne LeCroy
The SierraNet M328™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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SierraNet M328Q -
Teledyne LeCroy
The SierraNet M328Q™ system provides for analysis and jamming of 10/25/40/50/100Gbps Ethernet and Gen 6 (32G) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with two QSFP28 FlexPorts™ for maximum configuration and utility, the SierraNet M328Q includes an easy to use, customizable software interface, large capture buffers, and the most advanced capture, triggering, impairment and filtering capabilities in the industry.
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SierraNet T328 -
Teledyne LeCroy
The SierraNet T328 system provides for analysis of 10/25/40/50/100Gbps Ethernet and Gen 6 (32GFC) Fibre Channel data capture and protocol verification for developers & protocol test engineers in LAN, SAN, NAS and other Ethernet and Fibre Channel applications. Available with eight SFP28 FlexPorts™ for maximum configuration and utility, the SierraNet T328 includes an easy to use, customizable software interface, large capture buffers, and the most advanced T.A.P4 capture, triggering and filtering capabilities in the industry.
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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PC104p-429 -
Avionics Interface Technologies
Four or Eight Software Programmable Tx/Rx Channels -Programmable High/Low Speed Operation - Concurrent operation of all Tx/Rx Channels at high data rates - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - Real-Time Recording & Post Analysis of Multiple Channels - ANSI Application Interface supporting C++, C#, and .net Development - Device Driver Support: Windows, Linux, VxWorks, and other operating systems - Conformal coating available - Designed for extended temperature operations - PC/104+ specification v2.2 compliant
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Bruker AXS GmbH
Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Platinum 2.5K -
Ametek Power Instruments
For all types of power system events, the Platinum 2.5K Multi-Function Recorder provides all the information you need to capture the complete picture. This comprehensive fault recorder simultaneously performs transient, sequence of events and disturbance recordings, phasor measurements and power quality analysis. All of these functions are performed at the highest level so it will meet your needs of today and the future. In a deregulated environment, the Platinum 2.5K is the best tool to provide the necessary data to increase revenues and retain your customer.
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Agilent Technologies
Set up your lab faster with ready-to-run eMethods. With Agilent eMethods, Agilent we’ve has done the hard work for you. eMethods are designed to accelerate your startup time by condensing large the vast amounts of technical information and optimized analytical methods into a ready-to-run, downloadable, digital information package.Each eMethod supplies you with information on the instrument configuration, consumables, Sample Preparation Protocols, Analytical methods for sample introduction, chromatographic separation, detection, and data analysis.
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NanoSight Range -
Malvern Panalytical Ltd
The Malvern Panalytical NanoSight range of instruments utilizes Nanoparticle Tracking Analysis (NTA) to characterize nanoparticles from 10nm -2000nm* in solution. Each particle is individually but simultaneously analyzed by direct observation and measurement of diffusion events. This particle-by-particle methodology produces high resolution results for nanoparticle size distribution and concentration, while visual validation provides users with additional confidence in their data. Both particle size and concentration are measured, while a fluorescence mode provides differentiation of intrinsic or fluorescently labelled nanoparticles.
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ALTO-SD-150/200 -
Alto Inspection Corp.
ALTO-SD SERIES IS AN IN-LINE INSPECTION SYSTEM SUPPLYING HIGH THROUGHPUT, FULL SURFACE DEFECT INSPECTION FOR ALL KINDS OF WAFERS INCLUDING SILICON, QUARTZ, SAPPHIRE, COMPOUND AND MEMS WAFERS. HIGH-RESOLUTION CAMERA OPTICS PLUS LED ILLUMINATION GUARANTEE RELIABLE DETECTION OF ALL LOCAL DEFECTS. IT INSPECTS DEFECT SIZE OF 1~ 10 MICRONS, CONFIGURABLE INSPECTION RESOLUTION TO OPTIMIZE DEFECT SIZE VS. THROUGHPUT. THE SYSTEM COMBINES HIGH-PRECISION MEASUREMENT, POWERFUL DATA ANALYSIS AND USER-FRIENDLY OPERATIONS.
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CEMS-2000B FT -
Focused Photonics Inc.
CEMS-2000 B FT system uses direct thermal wet extraction method based on FTIR gas analysis technology, the system mainly has three major components: sampling pre-process-ing system, FTIR gas analyzer,and data acquisition and processing unit. The system can simultaneously monitor multiple groups of components in flue gas such as SO, NO, NO2, NOx, NH3, HCL, HF, O2, CO, CO2, CH4, H2O, etc. It is especially suitable for waste incineration.
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NS2 -
Applied NanoFluorescence, LLC
NS2 is the world's only three-in-one spectrometer for carbon nanotubes. The NS2 provides all of model NS1's state-of-the-art capabilities for analyzing SWCNT samples through near-IR fluorescence and absorption. In addition, the NS2 captures Raman spectra of all CNTs, whether single-walled, multi-walled aggregated, large diameter, or chemically altered. All spectra are automatically measured with a single placement of the sample cuvette. Sophisticated software then performs integrated data analysis to characterize the CNT sample.
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DSOX4032A -
Keysight Technologies
350 MHz2 analog channels Easily view signals on the large 12.1-inch capacitive touch screen Isolate signals in seconds with exclusive Zone touch triggering Capture more data with 4 Mpts memory and standard segmented memory See more signal detail with 1,000,000 wfms/s update rate Expand your measurement capabilities with full upgradability: Add bandwidth, digital channels, dual-ch 20 MHz arbitrary Wave Gen, 3-digit DVM, serial trigger and analysis & mask testing
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DSOX4024A -
Keysight Technologies
200 MHz4 analog channels Easily view signals on the large 12.1-inch capacitive touch screen Isolate signals in seconds with exclusive Zone touch triggering Capture more data with 4 Mpts memory and standard segmented memory See more signal detail with 1,000,000 wfms/s update rate Expand your measurement capabilities with full upgradability: Add bandwidth, digital channels, dual-ch 20 MHz arbitrary WaveGen, 3-digit DVM, serial trigger and analysis & mask testing
